Snap-On Announces Third and Fourth Series of TechEd Seminars
Snap-on has published dates for the third and fourth in its series of highly successful TechEd seminars, the first two of which have attracted approaching 20,000 participants over the past two-and-a-half years. The first in the series of TechEd seminars focussed on ‘Diagnosing Intermittent Faults’, while the second covered ‘Advanced Diagnostics Information’.
Open to all technicians, not just those using Snap-on branded equipment, Snap-on’s DPSs are now delivering these informative and educational seminars designed to appeal to every level of technician from all workshop types at 55 locations around the UK. They are conducted at a nominal charge of £40 – which includes a £20 Snap-on Tools voucher, refreshments and copies of the seminar notes and hand-outs. Each presentation lasts for approximately 2 hours.
The third seminar in the series of TechEd seminars is about to get underway. As the result of technician demand this new seminar will have the working title of ‘Diesel’. Subjects to be covered include: How diesels work; The history of the diesel engine; Safety issues; The advantages of diesel over petrol; The VW Pump Duse System; Common rail and its benefits and ‘Real world vehicle case studies’.
The fourth seminar has the working title of ‘CANbus’. The content of this seminar includes: An introduction to vehicle networking; How CANbus works; What happens if it fails; Vehicle applications; Testing the vehicle layer plus ‘A look to the future’.
“In the fast moving world of vehicle diagnostics, as our first TechEd seminar has proved, time is precious, and keeping up to date with diagnostic techniques and technology can be difficult for the modern technician,” explains Helen Taylor, UK Marketing Manager for Snap-on Diagnostics. “At Snap-on we have always been committed to providing the best quality products, information and training for the modern technician and these third and fourth in the series of seminars has been specifically based upon input gathered from attendees at earlier TechEd Seminars.”
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